Electrical contact probe with compliant internal interconnect

Details Electrical contact probe with compliant internal interconnect Electrical contact probe with compliant internal interconnect

2007-08-14

2007-08-14

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11450231

ABSTRACT:
A compliant electrical interconnect having a first component and a second component interlockingly engaged with the first component. Each component has two cantilever arms lockingly engaged and continuously biased against each other. Contact springs are captivated by the cantilever arms providing a contact force for the first and second components.

REFERENCES:
patent: 6299459 (2001-10-01), Botka et al.
patent: 6396293 (2002-05-01), Vinther et al.
patent: 6398592 (2002-06-01), Mori et al.
patent: 6462567 (2002-10-01), Vinther et al.
patent: 6506082 (2003-01-01), Meek et al.
patent: 6769919 (2004-08-01), Kosmala
patent: 7025602 (2006-04-01), Hwang
patent: 2002/0113609 (2002-08-01), Noda

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