Electrical contact probe for sampling high frequency electrical

Details Electrical contact probe for sampling high frequency electrical Electrical contact probe for sampling high frequency electrical

1996-08-08

1998-12-08

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3128

Patent

active

058475699

ABSTRACT:
An all-electrical high frequency contact sampling probe provides sub-micron spatial resolution and picosecond or sub-picosecond temporal resolution. In a preferred embodiment, the probe is a monolithic integration of a sampling circuit with a cantilever and probe tip, where the distance between the circuit and the tip is less than a wavelength of interest in representation of the RF signal. Applications include testing signals at interior nodes of high speed integrated circuits.

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patent: 5442300 (1995-08-01), Nees et al.
J. Nees et al., Picosencond Detector, Optical Temporal Analyzer, and Free-Standing Circuit probe lOSA Proc. on Ultafast electronics and Optoelectronics 1993, vol. 14, pp. 186-188. (unvaailable month).
J.A. Nees et al., Integrated atomic force microscope and ultrafast sampling probe, Ultrafast Phenomena, 1994 Technical Digest Series, vol. 7, pp. 307-309. Optical Society of America (unavilable month).

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