Electrical contact probe

Details Electrical contact probe Electrical contact probe

1983-09-14

1986-02-18

Levy, Stewart J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106

Patent

active

045715408

ABSTRACT:
An electrical contact probe is produced by four passes of a profiled machining cutter across the longitudinal axis of the probe at circumferentially equidistantly spaced points and with the machining cutter on each pass traveling on a linear path disposed at an acute angle to the longitudinal axis of the probe. The contact probe so produced has a long pyramid center point surrounded concentrically by eight modified pyramid points in two levels or heights. The shortest level points are arranged in alternating relation with the other points surrounding the center point and all of the surrounding points are of lesser height than the center point.

REFERENCES:
patent: 4105970 (1978-08-01), Katz
patent: 4417206 (1983-11-01), Stowers

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