Electrical connector for semiconductor device test fixture...

Details Electrical connector for semiconductor device test fixture... Electrical connector for semiconductor device test fixture...

2008-07-29

2008-07-29

Nguyen, Vincent Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C439S078000

Reexamination Certificate

active

07405573

ABSTRACT:
An interconnect assembly is for use in connection with a semiconductor device under test (DUT) having a plurality of leads to electronic test equipment. The interconnect assembly includes a cable including a plurality of wires with at least one wire for sensing a signal from a DUT, at least one wire for a forcing signal to the DUTY and at least one wire for a guarding signal driven by the same electrical potential as the forcing signal. A male connector includes the plurality of wires, an outer metal coating surrounding the plurality of wires, and an insulating coating around the outer metal coating. A receptacle connector is for receiving the male connector and plurality of wires with corresponding contacts.

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Search Report in corresponding Singaporean application No. 20060637-3, mailed May 22, 2008.
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