Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2001-01-30
2002-11-12
Le, N. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C439S289000, C439S310000, C439S701000
Reexamination Certificate
active
06480005
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an electrical connection testing device and to an electrical connection testing method for terminal fittings accommodated in a connector.
2. Description of the Related Art
Electrical connection testing devices are used to test electrical connections of terminal fittings that are accommodated in cavities of a connector. The connector has an engaging side, and the cavities have through openings at the engaging side for receiving the terminal fittings of a mating connector. The typical prior art electrical testing device functions by inserting testing probes into the through openings of the cavities at the engaging side of the connector and bringing the leading ends of the probes into contact with the terminal fittings that are locked in the cavities.
Female terminal fittings present a problem with the above-described electrical connection devices because only hollow portions of the female terminal fittings can be seen from the probe inserting side and because end surfaces of the female terminal fittings that are contacted by the probes cannot be seen. Further, the probes are inserted toward the terminal fittings in the same direction as the inserting direction of the mating terminal fittings, and hence the probes may damage the terminal fittings and/or the connector. Accordingly problems of reliability in electrical contact and connection precision may arise during connection with a mating connector.
In view of the above, electrical connecting testing devices for female terminal fittings typically are of the side probe type. More particularly, testing holes are formed in side walls of a connector housing and extend in a direction normal to a terminal inserting direction. The testing probes then are inserted through the testing holes in the side walls instead of being inserted through the openings at the leading ends of cavities. Thus, the testing probes contact the sides of the terminal fittings.
The applicant of the present invention proposed an electrical connection testing apparatus of the side probe type, as shown in
FIG. 17
of Japanese Unexamined Patent Publication No. 6-258373. This device is constructed such that probes
2
are inserted into testing holes
1
a
formed in one side wall of a connector
1
. The probes
2
are L-shaped. Leading ends of the probes
2
are bent to extend down and are inserted into the testing holes
1
a.
The above-described testing apparatus has testing holes
1
a
that can be formed only in one side wall (upper wall in
FIG. 8
) of the connector
1
. Thus, only one stage of cavities can be provided in the connector
1
. Many connectors are formed with cavities arrayed at two stages, and the above device cannot be applied to such connectors.
In view of the above problem, an object of the present invention is to provide an electrical connection testing device of the side probe type and an electrical connection method which allow for an easy testing of two stage connectors.
SUMMARY OF THE INVENTION
The subject invention is directed to an electrical connection testing device for testing electrical connections of terminal fittings in a connector. The testing is carried out by inserting testing probes at least partly through testing holes formed in side walls of a connector housing. The testing holes extend at an angle different from 0° or 180° to a mating direction of the terminal fittings with mating terminal fittings, and preferably substantially normal thereto. Thus, the testing probes can be brought elastically into contact with side surfaces of the terminal fittings of the connector.
The electrical connection testing device comprises a connector holder that is adapted to hold the connector. The connector holder is formed with probe insertion holes through which the probes can be inserted for contact with the terminal fittings of the connector.
The electrical connection testing device further includes first and second probe holders that carry the respective probes. A relative movement mechanism is provided for displacing the first probe holder, the second probe holder and/or the connector holder with respect to each other to insert the probes into the probe insertion holes and into contact with the terminal fittings of the held connector.
The testing device may comprise a base to which the first probe holder is secured. The connector holder and the second probe holder may be provided successively on the base for movement toward and away from the first probe holder.
The relative displacement mechanism preferably comprises a pushing mechanism for pushing a receiving surface of one of the probe holders at a side opposite from the connector holder. For example, the second probe holder and the connector holder may be moved toward the first probe holder by moving the pushing mechanism toward the second probe holder. This movement positions the probes at testing positions where the probes can be inserted into testing holes of a connector from substantially opposite sides.
The connector holder may be formed with opposite side walls that have probe insertion holes, and the first and second probe holders may be arranged to face the opposite side walls of the connector holder. The pushing mechanism may be operative to push the second probe holder and the connector holder toward the first probe holder for inserting the probes into testing holes of a connector from opposite sides. Accordingly, the probes are brought into contact with the terminal fittings at the opposite sides to conduct an electrical connection test merely by having the pushing mechanism move the second probe holder toward the first probe holder and into the testing position. Thus operability can be improved.
Upon completion of a test, the connector holder and the second probe holder can be moved by a linking or pushing mechanism from the testing positions to retracted positions so that the tested connector can be removed from the connector holder and replaced by another connector. Specifically, the pushing mechanism is at its retracted position when the connector is placed into the connector holder. Accordingly, the probe holders and the connector holder also are at retracted positions and away from each other in this state and wait on standby at such positions so that they do not interfere with the connector that is being inserted or taken out. The pushing mechanism then exerts forces on the receiving surface of the second probe holder and pushes the second probe holder toward the first probe holder after the next connector is placed in the connector holder. Thus, the second probe holder interferes with one side of the connector holder to push the connector holder toward the first probe holder. Consequently, spaces between the first probe holder and the connector holder and between the connector holder and the second probe holder are narrowed to reach the specified testing positions. In these positions, the leading ends of the probes are inserted through the probe insertion holes of the connector holder, into the testing holes of the connector and into elastic contact with the respective terminal fittings to conduct an electrical connection test.
The pushing mechanism is moved away from the second probe holder after the electrical connection test, and the linking mechanism returns the connector holder and the second probe holder to the retracted positions. Thus, the respective probes are withdrawn from the testing holes of the connector, and the connector can be taken out of the connector holder.
The pushing mechanism preferably comprises a lever pivotally mounted at an end of a base or at the connector holder. A cam of the lever pushes the receiving surface of the second probe holder and/or a receiving surface of the first probe holder as the operable lever is pivoted.
The relative displacement mechanism preferably comprises a retraction linking mechanism for moving the second probe holder and the connector holder together to retracted positions where the connector can be mounted into and taken ou
Nagano Yuji
Nishino Akira
Suzuki Nobuhiro
Benson Walter
Casella Anthony J.
Hespos Gerald E.
Le N.
Sumitomo Wiring Systems Ltd.
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