Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-03-20
2010-12-28
Tang, Minh N (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S754090
Reexamination Certificate
active
07859282
ABSTRACT:
An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.
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Pat. Abstract of JP (2004191064), Jul. 8, 2004, Micronics Japan Co. LTD.
Pat. Abstract of JP (2007003334), Jan. 11, 2007, Micronics Japan Co. LTD.
Akahira Akihisa
Miura Kiyotoshi
Sato Hitoshi
Ingrassia Fisher & Lorenz P.C.
Kabushiki Kaisha Nihon Micronics
Nguyen Trung Q
Tang Minh N
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