Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-08
2009-11-17
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07619425
ABSTRACT:
An electrical connecting apparatus comprises a plurality of plate-shaped probes. Each probe has a cut-off portion opening on its inside surface side and both sides in the thickness direction of the probe and is engaged with a dropout preventing member disposed in a plate-shaped housing at the cut-off portion, thereby being prevented from dropping out of the housing.
REFERENCES:
patent: 5986459 (1999-11-01), Fukaya et al.
patent: 6323663 (2001-11-01), Nakata et al.
patent: 05-174880 (1993-07-01), None
patent: 2002-246128 (2002-08-01), None
Ingrassia Fisher & Lorenz P.C.
Kabushiki Kaisha Nihon Micronics
Nguyen Ha Tran T
Nguyen Trung Q
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