Electrical conductivity tester and methods thereof for accuratel

Details Electrical conductivity tester and methods thereof for accuratel Electrical conductivity tester and methods thereof for accuratel

1992-12-03

1996-04-16

Snow, Walter E.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324227, 324719, 324765, G01N 2772, G01R 3312, G01R 3126

Patent

active

055086101

ABSTRACT:
An electrical conductivity tester accurately measures the time-varying electrical conductivity .sigma.(t) and steady-state electrical conductivity .sigma..sub.ss of a test material. In a first embodiment, the transmission phase of a probe circuit is monitored to determine the conductivity of a test material. In the first embodiment, an oscillator circuit generates a reference oscillator signal. A probe circuit receives the reference oscillator signal, magnetically couples to the test material, and modifies the reference oscillator signal via electromagnetic induction to derive a modified transmission phase signal. Finally, a phase detector circuit derives a transmission phase signal by combining the reference oscillator signal and the modified transmission phase signal, the transmission phase signal being directly convertible to the conductivity. In a second embodiment, an amplifier is connected to the probe circuit to form an oscillator circuit. The oscillator circuit generates an oscillator signal in response to the magnetic coupling of the probe circuit with the test material. A frequency discriminator generates a frequency signal from the oscillator signal, the frequency signal being convertible to the conductivity.

REFERENCES:
patent: 3805160 (1974-04-01), Philbrick et al.
patent: 3890564 (1975-06-01), Watanabe et al.
patent: 3953796 (1976-04-01), Keller
patent: 4059795 (1977-11-01), Mordwinkin
patent: 4074186 (1978-02-01), Flaherty
patent: 4303885 (1981-12-01), Davis et al.
patent: 4424486 (1984-01-01), Denton et al.
patent: 4475083 (1984-10-01), Linder
patent: 4651093 (1987-03-01), Detriche et al.
patent: 5017869 (1991-05-01), Oliver
patent: 5045789 (1991-09-01), Inoue et al.
patent: 5055784 (1991-10-01), Jaeger et al.
Ciszek, T. F., et al., "Some Effects of Crystal Growth Parameters on Minority Carrier Lifetime in Float-Zoned Silicon," J. Electrochem Soc., vol. 136, No. 1, Jan. 1989, pp. 230-234.
Pang, S. K., et al., "Effect of Oxygen Concentration on Lifetime in Magnetic Czochralski Silicon," J. Electro-chem Soc., vol. 138, No. 2, Feb. 1989, pp. 523-527.
Pang, S. K. , et al., "Record high recombination lifetime in oxidized magnetic Czochralski silicon," Appl. Phys. Lett., vol. 59, No. 2, Jul. 8, 1991, pp. 195-197.

Affiliated with

Also associated with

Rating

Electrical conductivity tester and methods thereof for accuratel does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrical conductivity tester and methods thereof for accuratel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical conductivity tester and methods thereof for accuratel will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-327619