Electrical circuit testing apparatus

Details Electrical circuit testing apparatus Electrical circuit testing apparatus

1985-06-06

1986-12-30

McQuade, John

Geometrical instruments

29842, 339 17CF, 339 91R, 339255R, H01R 13639

Patent

active

046324852

ABSTRACT:
A connector apparatus which is useful in testing electrical circuits where it is desired to mate test equipment to conventional integrated circuit sockets is disclosed. Spring probes make electrical contact with integrated circuit socket pins. J-shaped members of the apparatus have fingers which engage conventional integrated circuit sockets between the socket and a circuit board to clamp the apparatus to the socket. Fasteners lock the apparatus in this clamped position.

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patent: 4541676 (1985-09-01), Hansen et al.
"Trends in Probe Applications"; Glau, Gordon; Circuits Manufacturing; Aug. 1981.
Everett/Charles Catalog, 1982.

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