Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2006-02-28
2006-02-28
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237500, C250S559340
Reexamination Certificate
active
07006212
ABSTRACT:
A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attribute information and second attribute information is analyzed to determine an inspection attribute of the conductor at the conductor location. Attribute information may relate to one or more of: reflectance, fluorescence or height.
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Markov Igor
Savareigo Nissim
Zemer Dan
Nguyen Sang H.
Orbotech Ltd.
Sughrue & Mion, PLLC
Toatley , Jr. Gregory J.
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