Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2005-03-22
2005-03-22
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237100
Reexamination Certificate
active
06870611
ABSTRACT:
A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attribute information and second attribute information is analyzed to determine an inspection attribute of the conductor at the conductor location. Attribute information may relate to one or more of: reflectance, fluorescence or height.
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Markov Igor
Savareigo Nissim
Zemer Dan
Nguyen Sang H.
Orbotech Ltd.
Toatley , Jr. Gregory J.
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