Electrical circuit and method for testing integrated circuits

Details Electrical circuit and method for testing integrated circuits Electrical circuit and method for testing integrated circuits

2007-08-14

2007-08-14

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

10937116

ABSTRACT:
An electrical circuit including a test circuit and a method of testing electrical circuits is disclosed. In one embodiment, the circuit includes a electrical short-circuit protective circuit according to the invention for protecting an input contact against short-circuit having an input which is intended for connection to a signal generator, and an output which is intended for connection to a input contact. The input contact can be decoupled from the region lying upstream of the input of the electrical short-circuit protective circuit by the electrical short-circuit protective circuit.

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Fairchild Semiconductor Corporation, “LM2902, LM324/LM324A, LM224/LM224A Quad Operational Amplifier,” pp. 1-12 (2002). <www.fairchildsemi.com>.

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