Optical: systems and elements – Optical modulator – Light wave temporal modulation
Reexamination Certificate
2008-03-03
2009-08-25
Choi, William C (Department: 2873)
Optical: systems and elements
Optical modulator
Light wave temporal modulation
C438S004000
Reexamination Certificate
active
07580176
ABSTRACT:
Disclosed herein are methods and systems for testing the electrical characteristics of reflective displays, including interferometric modulator displays. In one embodiment, a controlled voltage is applied to conductive leads in the display and the resulting current is measured. The voltage may be controlled so as to ensure that interferometric modulators do not actuate during the resistance measurements. Also disclosed are methods for conditioning interferometric modulator display by applying a voltage waveform that causes actuation of interferometric modulators in the display.
REFERENCES:
patent: 5559358 (1996-09-01), Burns et al.
patent: 6040937 (2000-03-01), Miles
patent: 6077452 (2000-06-01), Litvak
patent: 6285207 (2001-09-01), Listwan
patent: 6567715 (2003-05-01), Sinclair et al.
patent: 6657218 (2003-12-01), Noda
patent: 6674090 (2004-01-01), Chua et al.
patent: 6674562 (2004-01-01), Miles
patent: 6777249 (2004-08-01), Yamazaki
patent: 6781702 (2004-08-01), Giannakopoulos et al.
patent: 6950193 (2005-09-01), Discenzo
patent: 7123216 (2006-10-01), Miles
patent: 2002/0171636 (2002-11-01), Aarts et al.
patent: 2003/0218462 (2003-11-01), Dick et al.
patent: 2004/0042000 (2004-03-01), Mehrl et al.
patent: 2004/0051929 (2004-03-01), Sampsell et al.
patent: 2004/0262604 (2004-12-01), Lee
patent: 2005/0030551 (2005-02-01), Rosakis et al.
patent: 2005/0042777 (2005-02-01), Boger et al.
patent: 2 217 839 (1989-11-01), None
patent: WO 02/093116 (2002-11-01), None
Conner, “Hybrid Color Display Using Optical Interference Filter Array,” SID Digest, pp. 577-580 (1993).
van Drieenhuizen, et al., “Comparison of Techniques for measuring Both Compressive and Tensile Stress in Thin Films.” Sensors and Acuators, vol. 37-38, pp. 759-765. (1993).
Guckel et al., “Fine-Grained Polysilicon Films with Built-In Tensile Strain,” IEEE Transactions on Electron Devices, vol. 35, No. 6, pp. 801-802, (1988).
Jerman et al., “A Miniature Fabry-Perot Interferometer with a Corrugated Silicon Diaphragm Support,” IEEE Electron Devices Society (1988).
Lin et al., “A Micro Strain Gauge with Mechanical Amplifier,” J. of Microelectromechanical Systems, vol. 6, No. 4, (1997).
Miles, “MEMS-based interferometric modulator for display applications,” Proc. SPIE vol. 3876, pp. 20-28, Sep. 1999.
Miles, “5.3: Digital Paper™: Reflective Displays Using Interferometric Modulation,” SID 00 Digest, pp. 32-35 (2000).
Miles, 10.1: Digital PaperTM for Reflective Displays, SID 02 Digest, pp. 115-117 (2002).
Miles et al., “Digital Paper™ for Reflective Displays,” J. of the Society for Information Display Soc. Inf. Display USA. vol. 11, No. 1, p. 209-215. (2003).
Raley et al., “A Fabry-Perot Microinterferometer for Visible Wavelengths,” IEEE Solid-State Sensor and Actuator Workshop, Hilton Head, SC (1992).
Singh et al., “Strain Studies in LPCVD Polysilicon for Surface Micromachined Devices,” Sensors and Actuators, vol. 77, pp. 133-138, (1999).
Srikar et al., “A Critical Review of Microscale Mechanical Testing Methods Used in the Design of Microelectromechanical Systems,” Society for Experimental mechanics, vol. 43, No. 3, (2003).
Zhang, et al., “Measurements of Residual Stresses in Thin Films Using Micro-Rotating-Structures.” Thin Solid Films, vol. 335, pp. 97-105, (1998).
Office Action mailed Sep. 29, 2006 in U.S. Appl. No. 11/097,511.
Office Action dated Jun. 13, 2008 in Chinese App. No. 200510102801.X.
Substantive Examination Adverse Report in Malaysian App. No. PI 20053304 dated Nov. 7, 2008.
Cummings William J
Gally Brian
Kothari Manish
Choi William C
IDC LLC
Knobbe Martens Olson & Bear LLP
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