Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-11-21
2006-11-21
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S627000, C324S658000
Reexamination Certificate
active
07138809
ABSTRACT:
An electrical capacitance proximity sensor with high detector sensitivity has an insulating substrate, a detector electrode and an earth electrode formed in a fixed pattern on one face of the insulating substrate, and a detector circuit which detects an object approaching the detector electrode and the earth electrode by detecting the capacitance between the detector electrode and the earth electrode. The detector electrode is formed in a shape such that it surrounds the earth electrode.
REFERENCES:
patent: 4766368 (1988-08-01), Cox
patent: 5223796 (1993-06-01), Waldman et al.
patent: 5227667 (1993-07-01), Takinami et al.
patent: 5512836 (1996-04-01), Chen et al.
patent: 5917314 (1999-06-01), Heger et al.
patent: 6724324 (2004-04-01), Lambert
patent: 6894507 (2005-05-01), Morimoto
Misaki Nobumasa
Nakamura Yasushi
Yajima Fumio
Deb Anjan
Fujikura Ltd.
Zhu John
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