Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2011-01-25
2011-01-25
Le, John H (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C374S005000, C702S117000
Reexamination Certificate
active
07877217
ABSTRACT:
A method and a system of testing electronic components assemblies, each assembly comprising a multiplicity of tracks, each connecting a multiplicity of ports. The system may enable applying heat energy upon at least one part of the at least one track; measuring energy diffusion within a predefined time interval of the heated part of the track; calculating at least one distribution energy diffusion profile associated according to the measured diffusion, where the profile represents the diffusion of energy versus time; and identifying defects in the at least one track, according to the analysis of the diffusion profile.
REFERENCES:
patent: 5608526 (1997-03-01), Piwonka-Corle et al.
patent: 6049220 (2000-04-01), Borden et al.
patent: 6430728 (2002-08-01), Goruganthu et al.
patent: 6512385 (2003-01-01), Pfaff et al.
patent: 6820028 (2004-11-01), Ye et al.
patent: 6840667 (2005-01-01), Schlagheck et al.
patent: 6971791 (2005-12-01), Borden et al.
patent: 2002/0027941 (2002-03-01), Schlagheck et al.
patent: 2002/0167987 (2002-11-01), Schlagheck et al.
patent: 2004/0028113 (2004-02-01), Schlagheck et al.
patent: WO0248720 (2002-06-01), None
International Search Report published Jul. 28, 2005 for PCT/IL2004/000842 filed Sep. 14, 2004.
International Search Report on Patentability published Mar. 16, 2006 for PCT/IL2004/000842 filed Sep. 14, 2004.
Written Opinion of the International Searching Authority published Mar. 16, 2006 for PCT/IL2004/000842 filed Sep. 14, 2004.
Bianco Paul D.
Fleit Martin
Fleit Gibbons Gutman Bonigni & Bianco PL
Invisible Ltd.
Le John H
LandOfFree
Electric ultimate defects analyzer detecting all defects in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electric ultimate defects analyzer detecting all defects in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electric ultimate defects analyzer detecting all defects in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2715682