Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2004-07-07
2008-12-02
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S058000, C702S060000, C702S069000
Reexamination Certificate
active
07460965
ABSTRACT:
It is a purpose to evaluate a tamper resistance of an actual circuit with a high accuracy and at a high speed in an upstream process of a circuit design. A tamper resistance evaluating apparatus includes a signal change time counter unit10for counting the number of times a signal in a logic circuit changes, a power consumption calculation unit20for calculating a power consumption in the logic circuit based on the number of times a signal changes, which is counted by the signal change time counter unit, a leaked-information analysis unit80for analyzing information leaked from the logic circuit based on the power consumption in the logic circuit calculated by the power consumption calculation unit, a file database40for storing a file used by a simulator30, a simulation control information producing unit50for producing control information for controlling the logic simulator30, a time sequence electric power information producing unit60for producing time sequence electric power information, in which the power consumptions calculated by the power consumption calculation unit20are arranged in a time sequence, and a result displaying unit70for displaying the time sequence electric power information.
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Saeki Minoru
Suzuki Daisuke
Birch & Stewart Kolasch & Birch, LLP
Mitsubishi Electric Corporation
Ramos-Feliciano Eliseo
Suarez Felix
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