Electricity: measuring and testing – Electrostatic field
Reexamination Certificate
2005-06-07
2009-02-10
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Electrostatic field
C324S072000, C324S663000, C324S458000, C318S652000, C399S073000, C257S314000
Reexamination Certificate
active
07489135
ABSTRACT:
The electric potential measuring instrument comprises an electrode arranged on a semiconductor substrate at a position opposite to the object of measurement and a modulator for modulating the coupling capacitance between the object of measurement and the electrode. The electrode is the gate electrode of a field effect type transistor. The modulated electric current that flows between the source diffusion region and the drain diffusion region of the field effect type transistor is synchronously detected by a detection circuit with the modulation frequency of the modulator. The output signal that appears on the gate electrode of a field effect transistor can be measured with ease by changing the coupling capacitance between the electrode of an electric potential measuring instrument and an object of measurement.
REFERENCES:
patent: 4030347 (1977-06-01), Norris et al.
patent: 4205267 (1980-05-01), Williams
patent: 4370616 (1983-01-01), Williams
patent: 4605946 (1986-08-01), Robinson, Jr.
patent: 4720682 (1988-01-01), Ikushima et al.
patent: 5212451 (1993-05-01), Werner, Jr.
patent: 5323115 (1994-06-01), Werner, Jr.
patent: 5504356 (1996-04-01), Takeuchi et al.
patent: 6160569 (2000-12-01), Fujimori et al.
patent: 6965239 (2005-11-01), Yasuda et al.
patent: 7049804 (2006-05-01), Ichimura et al.
patent: 7149442 (2006-12-01), Ushijima et al.
patent: 7212007 (2007-05-01), Yasuda et al.
patent: 7242882 (2007-07-01), Ichimura et al.
patent: 2003/0057977 (2003-03-01), Werner, Jr. et al.
patent: 2006/0186898 (2006-08-01), Ichimura et al.
patent: 2006/0192565 (2006-08-01), Yasuda et al.
patent: 2006/0267578 (2006-11-01), Ushijima et al.
patent: 2007/0154231 (2007-07-01), Ichimura et al.
patent: 27 15 831 (1978-10-01), None
patent: 43 28 083 (1994-03-01), None
patent: 100 44 887 (2001-05-01), None
patent: 1 003 044 (2000-05-01), None
patent: 02-071166 (1990-03-01), None
patent: 04-025764 (1992-01-01), None
patent: 06-196721 (1994-07-01), None
patent: 06-196722 (1994-07-01), None
patent: 08-110361 (1996-04-01), None
Riehl, P.S., “Microsystems for Electrostatic Sensing”, Dissertation, ′Online!, Nov. 2002, pp. 1-8, 32-40, 79-84.
Hsu, C.H. et al., “Micromechanical electrostatic voltmeter”, Transducers, San Francisco, Jun. 24-27, 1991, Proceedings of the International Conference on solid State Sensors and Actuators, New York, IEEE, US, vol. Conf. 6, Jun. 24, 1991, pp. 659-662.
Parak W J et al: “The field-effect-addressable potentiometric sensor/stimulator (FAPS)—a new concept for a surface potential sensor and stimulator with spatial resolution” Sensors and Actuators B, Elsevier Sequoia S.A., Lausanne, CH, vol. 58, No. 1-3, Sep. 21, 1999, pp. 497-504, XP004253054 ISSN: 0925-4005 figure 2.
PCT International Search Report in corresponding International Application No. PCT/JP2005/010758, dated Oct. 27, 2005.
Written Opinion of the International Searching Authority in corresponding International Application No. PCT/JP2005/010758, dated Oct. 27, 2005.
Official Action in Chinese Application No. 200580018541.6, dated Feb. 1, 2008.
Baldridge Benjamin M
Canon Kabushiki Kaisha
Dole Timothy J
Fitzpatrick ,Cella, Harper & Scinto
LandOfFree
Electric potential measuring instrument and image forming... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electric potential measuring instrument and image forming..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electric potential measuring instrument and image forming... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4063992