Electrophotography – Control of electrophotography process – Of plural processes
Reexamination Certificate
2007-03-09
2008-12-02
Gray, David M (Department: 2852)
Electrophotography
Control of electrophotography process
Of plural processes
C399S073000, C324S458000
Reexamination Certificate
active
07460803
ABSTRACT:
To provide an electric potential measuring device which is useful in realizing size reduction, high sensitivity, and high reliability. The electric potential measuring device includes: an oscillating device which includes torsion springs, and an oscillating body axially supported by the springs to oscillate; and signal detecting unit which is located on a surface of the oscillating body. A capacitance between the detection electrode and a surface of an electric potential measuring object is varied by varying a distance therebetween by the oscillating device, whereby an output signal appearing on the detection electrode is detected.
REFERENCES:
patent: 3852667 (1974-12-01), Williams et al.
patent: 4205267 (1980-05-01), Williams
patent: 4720682 (1988-01-01), Ikushima et al.
patent: 4763078 (1988-08-01), Williams
patent: 4835461 (1989-05-01), Snelling
patent: 5212451 (1993-05-01), Werner, Jr.
patent: 5317152 (1994-05-01), Takamatsu et al.
patent: 5357108 (1994-10-01), Suzuki et al.
patent: 5554851 (1996-09-01), Hirai et al.
patent: 5574279 (1996-11-01), Ikeda et al.
patent: 5923637 (1999-07-01), Shimada et al.
patent: 6046972 (2000-04-01), Kuroda et al.
patent: 6075639 (2000-06-01), Kino et al.
patent: 6163519 (2000-12-01), Kuroda et al.
patent: 6177800 (2001-01-01), Kubby et al.
patent: 6337477 (2002-01-01), Shimada et al.
patent: 6831765 (2004-12-01), Yasuda et al.
patent: 6965239 (2005-11-01), Yasuda et al.
patent: 7149442 (2006-12-01), Ushijima et al.
patent: 2003/0042907 (2003-03-01), Kieres et al.
patent: 2003/0057977 (2003-03-01), Werner, Jr. et al.
patent: 2004/0136045 (2004-07-01), Tran
patent: 2005/0046918 (2005-03-01), Yasuda et al.
patent: 2005/0174209 (2005-08-01), Teshima et al.
patent: 2006/0001432 (2006-01-01), Yasuda et al.
patent: 2006/0171728 (2006-08-01), Ichimura et al.
patent: 2006/0186898 (2006-08-01), Ichimuru
patent: 2006/0192565 (2006-08-01), Yasuda
patent: 2715831 (1978-10-01), None
patent: 10044877 (2001-05-01), None
patent: 1003044 (2000-05-01), None
patent: 1 234 799 (2002-08-01), None
patent: 2-71166 (1990-03-01), None
patent: 4-25764 (1992-01-01), None
patent: 6-196721 (1994-07-01), None
patent: 6-196722 (1994-07-01), None
patent: 2004088333 (2004-10-01), None
patent: 2004088335 (2004-10-01), None
C.H. Hsu, et al., “Micromechanical Electrostatic Voltmeter”, San Francisco, Jun. 24-27, 1991, Proceedings of the International Conference on Solid State Sensors and Actuators, New York, IEEE, US, vol. Conf. 6, Jun. 24, 1991, pp. 659-662.
P. S. Riehl, “Microsystems for Electrostatic Sensing”, Dissertation, Nov. 2002, pp. 1-8, 32-40 and 79-84, available at http://www-bsac.eecs.berkeley.edu/publications/search/zoom.php?urltimestamp=1040564878.
Ichimura Yoshikatsu
Mizoguchi Yasushi
Shimada Yasuhiro
Zaitsu Yoshitaka
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Gray David M
Ready Bryan
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