Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2006-05-23
2006-05-23
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S457000
Reexamination Certificate
active
07049804
ABSTRACT:
An electric potential measuring apparatus including a substrate disposed facing a measurement object, a detecting electrode provided insulated from the substrate, and a capacity modulating unit for modulating a coupling capacity between the detecting electrode and the measurement object. In the electric potential measuring apparatus, a region with a dielectric constant less than a dielectric constant of the substrate is formed in the substrate to achieve an increase in resistivity of a portion of the substrate between detecting electrodes, or a decrease in a stray capacity between the detecting electrode and the substrate.
REFERENCES:
patent: 6177800 (2001-01-01), Kubby
patent: 6888442 (2005-05-01), O'Reilly et al.
patent: 2004/0239306 (2004-12-01), Barrault et al.
Ichimura Yoshikatsu
Kandori Atsushi
Ushijima Takashi
Zaitsu Yoshitaka
Canon Kabushiki Kaisha
Canon U.S.A. Inc. IP Division
Nguyen Vincent Q.
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