Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2011-01-04
2011-01-04
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07861577
ABSTRACT:
An electric potential difference detection method detects an electric potential difference between a surface of a sample and a probe of a cantilever in a scanning probe microscope. An AC voltage having a frequency that is ½ of a resonance frequency of the cantilever is applied between the sample and the cantilever, and a magnitude of an amplitude of vibration of the cantilever is detected. On the basis of the detection, a determination is made as to whether an electric potential difference exists or does not exist between the surface of the sample and the cantilever probe. A determination that an electric potential difference between the surface of the sample and the cantilever probe does not exist is made in a case where the cantilever is resonating and the detected magnitude of the amplitude of vibration of the cantilever is greater than a predetermined magnitude.
REFERENCES:
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5723981 (1998-03-01), Hellemans et al.
patent: 6005246 (1999-12-01), Kitamura et al.
patent: 6073485 (2000-06-01), Kitamura
patent: 6097197 (2000-08-01), Matsuyama et al.
patent: 6337478 (2002-01-01), Uehara et al.
patent: 6507197 (2003-01-01), Itoh et al.
patent: 2002055040 (2002-02-01), None
patent: 2002-195927 (2002-07-01), None
patent: 2003042931 (2003-02-01), None
patent: 2004226237 (2004-08-01), None
Inoue Akira
Shigeno Masatsugu
Adams & Wilks
Larkin Daniel S
Seiko Instruments Inc.
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