Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-03-15
1997-07-29
Nguyen, Vinh P.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
318490, G01R 2718
Patent
active
056525265
ABSTRACT:
An analyzer for performing high and low voltage tests on an electric induction machine having electric power input terminals. The analyzer comprises: (a) a high voltage testing circuit for performing high voltage tests on the induction machine; (b) a low voltage testing circuit for performing low voltage tests on the induction machine; (c) electrical terminals for electrical connection with the power input terminals of the induction machine; (d) a plurality of switches electrically connecting the high voltage testing circuit and the low voltage testing circuit to the terminals, each switch having one or more control input terminals for receiving control signals for closing and opening the switch; and (e) a controller having a first set of output terminals electrically connected to the control input terminals of the switches, the controller providing control signals to the switches to selectively open one or more of the switches and to selectively close one or more of the switches to: (i) provide electrical conduction paths between the high voltage testing circuit and the induction machine through the closed switches, while electrically isolating the low voltage testing circuit from the high voltage testing circuit through the open switches; and (ii) provide electrical conduction paths between the low voltage testing circuit and the conduction machine through the closed switches, while electrically isolating the high voltage testing circuit from the low voltage testing circuit through the open switches.
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Baker Tom
Cabison Manuel R.
Kerszenbaum Isidor
Lopetrone Juan P.
Sullivan Kevin C.
Anderson Denton L.
Bowser Barry C.
Nguyen Vinh P.
Southern California Edison Company
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