Electric field measurement of optical waveforms

Details Electric field measurement of optical waveforms Electric field measurement of optical waveforms

2005-12-30

2008-08-12

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

Having light beams of different frequencies

Reexamination Certificate

active

07411683

ABSTRACT:
Time magnification and heterodyning are combined to allow the single-shot characterization of the electric field of optical waveforms. The electric field of the source under test is obtained by Fourier processing of the magnified temporal intensity of the source heterodyned with a monochromatic source. An experimental implementation of this technique is characterized and used to measure various optical signals.

REFERENCES:
patent: 4856899 (1989-08-01), Iwaoka et al.
patent: 5684586 (1997-11-01), Fortenberry et al.
patent: 6611336 (2003-08-01), Walmsley et al.
patent: 6633386 (2003-10-01), Walmsley et al.
patent: 7145713 (2006-12-01), Chang et al.
patent: 2004/0165885 (2004-08-01), Dorrer
patent: 2006/0140638 (2006-06-01), Dorrer

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