Radiant energy – Ionic separation or analysis
Patent
1997-09-25
2000-03-21
Nguyen, Kiet T.
Radiant energy
Ionic separation or analysis
250286, 250290, 250291, 250292, H01J 4942
Patent
active
060405732
ABSTRACT:
A technique to produce a device for generating an electric field is disclosed. This electric field may be customized to direct movement of charged particles in a predetermined manner. Moreover, this device is readily installed and removed from a charged particle analyzer to facilitate interchange with other devices capable of generating electric fields with different characteristics. The device may be provided by etching an electrically conductive layer clad to a flexible dielectric substrate to define a predetermined conductive pattern. This pattern is then oriented relative to a charged particle pathway and an electric potential applied to generate the desired electric field.
REFERENCES:
patent: 4261698 (1981-04-01), Carr et al.
patent: 4317029 (1982-02-01), Warthan
patent: 4443319 (1984-04-01), Chait et al.
patent: 4870283 (1989-09-01), Taya
patent: 4985626 (1991-01-01), Margulies
patent: 5070240 (1991-12-01), Lee et al.
patent: 5109157 (1992-04-01), Loen
patent: 5117107 (1992-05-01), Guilhaus et al.
patent: 5147522 (1992-09-01), Sarrine
patent: 5148021 (1992-09-01), Okamoto et al.
patent: 5154625 (1992-10-01), Borokowski et al.
patent: 5162649 (1992-11-01), Burke
patent: 5245185 (1993-09-01), Busch et al.
patent: 5280175 (1994-01-01), Karl
patent: 5283436 (1994-02-01), Wang
patent: 5302827 (1994-04-01), Foley
patent: 5451781 (1995-09-01), Dietrich et al.
patent: 5468958 (1995-11-01), Franzen et al.
patent: 5510613 (1996-04-01), Reilly et al.
patent: 5563571 (1996-10-01), Sobhani
patent: 5600293 (1997-02-01), Hunter
Herbert H. Hill, Jr., William F. Siems, and Robert H. St. Louis, Ion Mobiy Spectrometry, Analytical Chemistry, vol. 62, No. 23, Dec. 1, 1990.
Abstract, Lab on a Chip Uses Semiconductor Fab Technology, 1997.
Clemmer David E.
Sporleder C. Ray
Indiana University Advanced Research & Technology Institute Inc.
Nguyen Kiet T.
LandOfFree
Electric field generation for charged particle analyzers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electric field generation for charged particle analyzers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electric field generation for charged particle analyzers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-732312