Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2007-06-26
2009-12-29
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
C356S445000
Reexamination Certificate
active
07639355
ABSTRACT:
Various aspects of the present invention are directed to electric-field-enhancement structures and detection apparatuses that employ such electric-field-enhancement structures. In one aspect of the present invention, an electric-field-enhancement structure includes a substrate having a surface. The substrate is capable of supporting a planar mode having a planar-mode frequency. A plurality of nanofeatures is associated with the surface, and each of nanofeatures exhibits a localized-surface-plasmon mode having a localized-surface-plasmon frequency approximately equal to the planar-mode frequency.
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International Search Report; PCT Patent Application No. PCT/US2008/007934, filed Jun. 25, 2008; search issued by Korean Patent Office (ISA) Dec. 31, 2008.
Blackstock Jason
Fattal David A.
Li Zhiyong
Stewart Duncan
Tong William M.
Hewlett--Packard Development Company, L.P.
Nur Abdullahi
Toatley Jr. Gregory J
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