Electric device or circuit testing method and apparatus

Details Electric device or circuit testing method and apparatus Electric device or circuit testing method and apparatus

1984-07-19

1987-08-11

Krass, Errol A.

Boots, shoes, and leggings

364551, 364164, 371 25, G01F 1520, G06G 762, G05B 1302, G01R 3128

Patent

active

046866280

ABSTRACT:
A method and apparatus for testing an electrical device and/or circuit in which the device or circuit is stimulated with a known input signal and in which three or more measurements of the response of the device or circuit to such stimulus are taken and utilized to predict a final value of such response according to a predetermined relationship between such predicted final response and the measured response values. Typically the present invention can predict such final value without waiting for the actual final value of the response to occur.

REFERENCES:
patent: 3978325 (1976-08-01), Goldstein et al.
patent: 4176556 (1979-12-01), Takenaka
patent: 4455612 (1984-06-01), Girgis et al.
patent: 4569012 (1986-02-01), Sekozawa
patent: 4574359 (1986-03-01), Ishizaka et al.
Moore et al., "Improved Algorithm for Direct Digital Control", Instruments and Control Systems, Jan. 1970, pp. 70-74.

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