Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2006-06-06
2006-06-06
Jackson, Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S758000
Reexamination Certificate
active
07057288
ABSTRACT:
A wiring groove is formed in an insulating film, and then a reformed layer is formed in the vicinity of the wiring groove in the insulating film. Thereafter, a conductive film is buried in the wiring groove, thereby forming a wire. Subsequently, the reformed layer is removed to form a slit, and then a low-dielectric-constant film having a relative dielectric constant lower than the insulating film is buried in the slit.
REFERENCES:
patent: 5616959 (1997-04-01), Jeng
patent: 6162743 (2000-12-01), Chu et al.
patent: 6291628 (2001-09-01), Chen et al.
patent: 6483193 (2002-11-01), Usami
patent: 2002/0052106 (2002-05-01), Ikura
patent: P2002-93903 (2002-03-01), None
Jackson Jerome
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
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