Electricity: measuring and testing – Fault detecting in electric circuits and of electric components
Reexamination Certificate
2005-11-01
2005-11-01
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
C324S551000, C324S765010
Reexamination Certificate
active
06960915
ABSTRACT:
An electric circuit system for detecting a short circuit between output PINs of different ICs, particularly CMOS-ICs, which in each case have a first switching element, particularly a highside transistor and a second switching element, particularly a lowside transistor as output driver, the first switching element and the second switching element of the respective output drivers having different source-drain resistances in the switched-on state.
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R. J. Baker. H. W. LI, D.E. Boyce: “CMOS Design, Layout and Simulation”, IEEE Press, Piscataway, NJ 08855-1331 XP002280706, p. 201—p. 230, Pictures 11.5, 11.6, 11.8, 11.24, Example 11.3, no date.
European Search Report, May 27, 2004, EPO 2017194.
Haeuser Thomas
Hesselbarth Johannes
Deb Anjan
Kenyon & Kenyon
Robert & Bosch GmbH
Teresinski John
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