Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2005-03-01
2005-03-01
Niebling, John F. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C438S015000, C438S006000, C438S010000
Reexamination Certificate
active
06861269
ABSTRACT:
A method of fabricating an electric circuit, including first and second working processes of performing respective first and second working operations on a circuit substrate, where3in the first working process includes a first substrate-identifying step of obtaining substrate identifying information identifying the substrate on which the first working operation is to be performed, a specific-information obtaining step of recognizing a specific-information providing portion of the substrate, to obtain specific information indicating at least one specific characteristic of the substrate, a first working step of performing the first working operation on the basis of the obtained specific information, and a specific-information storing step of storing the specific information in relation to the substrate identifying information, and the second working process includes a second substrate-identifying step of obtaining the substrate identifying information identifying the substrate on which the second working operation is to be performed, and a second working step of performing the second working operation on the basis of the specific information stored in relation to the substrate identifying information. Also disclosed are electric-circuit fabricating system and control program suitable to practice the method.
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Kawai Takayoshi
Kodama Seigo
Mitsui Kazuo
Fuji Machine Mfg. Co. Ltd.
Luk Olivia
Niebling John F.
Oliff & Berridg,e PLC
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