Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1989-06-01
1990-03-06
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324557, 310327, G01R 3100, H01L 4108
Patent
active
049069179
ABSTRACT:
A method and apparatus for monitoring the degradation of elastomeric materials is provided. Piezoelectric oscillators are placed in contact with the elastomeric material so that a forced harmonic oscillator with damping is formed. The piezoelectric material is connected to an oscillator circuit,. A parameter such as the resonant frequency, amplitude or Q value of the oscillating system is related to the elasticity of the elastomeric material. Degradation of the elastomeric material causes changes in its elasticity which, in turn, causes the resonant frequency, amplitude or Q of the oscillator to change. These changes are monitored with a peak height monitor, frequency counter, Q-meter, spectrum analyzer, or other measurement circuit. Elasticity of elastomers can be monitored in situ, using miniaturized sensors.
REFERENCES:
patent: 3269175 (1966-08-01), Sprosty
patent: 3401276 (1968-09-01), Curran et al.
Hirschfeld, deceased Tomas B.
Olness Dolores U.
Carnahan L. E.
Eisenzopf Reinhard J.
Harvey Jack B.
Moser William R.
Sartorio Henry P.
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