Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-01-10
2008-11-04
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
07446548
ABSTRACT:
An elastic micro probe includes an electrically conductive and stretchable spring, which has a first end, a second end opposite to the first end, and connection points disposed adjacent to the first end for connection to an external element, an electrically conductive probe body, which has a first end connected to the second end of the spring and a second end vertically upwardly protruding over the first end of the spring, and an electrically conductive tip, which has a bottom side connected to the second end of the probe body such that when the tip is pressed, the probe body is forced to move the second end of the spring, thereby causing the spring to be stretched and elastically deformed.
REFERENCES:
patent: 5388998 (1995-02-01), Grange et al.
patent: 5447442 (1995-09-01), Swart
patent: 6909056 (2005-06-01), Vinther
Bacon & Thomas PLLC
MJC Probe Incorporation
Nguyen Vinh P
LandOfFree
Elastic micro probe and method of making same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Elastic micro probe and method of making same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Elastic micro probe and method of making same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4040900