Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-08-23
2005-08-23
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S070000, C702S179000, C700S055000, C714S709000, C708S422000, C708S290000, C382S113000, C382S190000
Reexamination Certificate
active
06934647
ABSTRACT:
Method and apparatus for determining at least one characteristic of a digital data signal. The method includes identifying at least one region of a waveform such as an Eye Diagram that contains information for determining at least one characteristic of interest of the digital data signal. Sufficient samples of the digital data signal are then taken to fully construct only the identified at least one region of the Eye Diagram without fully constructing the entire Eye diagram, and the at least one characteristic of interest is then determined from the fully constructed at least one region of the Eye Diagram.
REFERENCES:
patent: 5978742 (1999-11-01), Pickerd
patent: 6546345 (2003-04-01), Ghiasi
patent: 6748338 (2004-06-01), Cheng
patent: 2003/0083833 (2003-05-01), Nygaard
patent: 2003/0165259 (2003-09-01), Balent et al.
patent: 2003/0220753 (2003-11-01), Pickerd et al.
Takara et al., ‘Eye-diagram Measurement of 100 Gbit/s Optical Signal using Optical Sampling’, Jan. 1996, EOC, pp. 4.7-4.10.
Jenq, ‘Perfect Reconstruction of Digital Spectrum from Non-Uniformly Sampled Signals’, Jun. 1997, IEEE Article, vol.:46, No. 3, pp. 649-652.
Ziperovich, ‘Performance Degradation of PRML Channels Due to Nonlinear Distortions’, Nov. 1991, IEEE, pp. 4825-4827.
Jayamsimaha et al., ‘Design of Nyquist and Near-Nyquist Pulses with Spectral Constraints’, Jan. 2000, Signion, pagges 1-6.
Agilent Technologie,s Inc.
Desta Elias
Wachsman Hal
LandOfFree
Efficient sampling of digital waveforms for eye diagram... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Efficient sampling of digital waveforms for eye diagram..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Efficient sampling of digital waveforms for eye diagram... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3519163