Efficient narrow spectral width soft-X-ray discharge sources

X-ray or gamma ray systems or devices – Source

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378143, 2504931, H05G 200

Patent

active

054992826

ABSTRACT:
Methods for making pulsed and continuous discharge plasma light sources for extreme ultraviolet(EUV) projection lithography and soft-x-ray microscopy as well as other applications are disclosed. A first light source of doubly ionized lithium ions emits over a narrow bandwidth of approximately 13.5 nm. A second light source of beryllium ions radiates at approximately 7.60 nm. A third light source of boron ions radiates at approximately 4.86 nm, and a fourth light source of carbon ions radiates at approximately 3.38 nm. Preferred embodiments of apparatus for generating pulsed and continuous discharge sources are disclosed.

REFERENCES:
patent: 4229708 (1980-10-01), Mani et al.
patent: 4538291 (1985-08-01), Iwamatsu
patent: 4592056 (1986-05-01), Elton
patent: 4860328 (1989-08-01), Frankel et al.
patent: 4872189 (1989-10-01), Frankel et al.
patent: 5117432 (1992-05-01), Nilsen
patent: 5177774 (1993-01-01), Suckewer et al.
patent: 5243638 (1993-09-01), Wang et al.
patent: 5327475 (1994-07-01), Golovanivsky et al.
"Line Spectra of the Elements," CRC Handbook of Chemistry and Physics, 59th ed., CRC Press Inc., Boca Raton Fla. pp. E 224, 225 229-271.
Silfvast et al. Simple metal-vapor recombination lasers using segmented plasma excitation, Appl. Phys. Lett. 36(8), Apr., 1980, pp. 615-617.
Marconi et al., Time-resolved extreme ultraviolet emission from a highly ionized lithium capillary discharge, Appl. Phys. Lett. 54(22), May, 1989, pp. 2180-2182.
Rocca et al., Study of the Soft X-ray Emission from Carbon Ions in Capillary Discharge, IEEE Journ. Quantum Electr., vol. 29 #1, Jan. 1983, pp. 182-191.
Nagata et al., Soft-X-Ray Ampl. of the Lyman Transition by Optic.-Field Induced Ioniz., American Physical Soc., vol. 71, #23, Dec. 1983, pp. 3774-3777.
Silfvast, William T., Development of Effic. Narrow Spectr. Width Soft-X-Ray Sources at 13.5nm, CREOL/Univ. Central Fla., Jan. 1994, pp. 1-5.
Silfvast, William T., Development of a Contin, Narrow Spectr. Width Soft-X Ray Sources at 13.5nm, CREOL/Univ. Central Fla., Jan. 1994, pp. 1-5.
Silfvast et al., Laser Plasma Source Charactiz. for SXPL, OSA Proceedings on Soft-X-Ray Proj. Lithog., vol. 18, May 1993, pp. 117-126.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Efficient narrow spectral width soft-X-ray discharge sources does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Efficient narrow spectral width soft-X-ray discharge sources, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Efficient narrow spectral width soft-X-ray discharge sources will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2106212

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.