Image analysis – Pattern recognition
Reexamination Certificate
2004-08-27
2008-12-02
Bali, Vikkram (Department: 2624)
Image analysis
Pattern recognition
C382S321000, C382S177000, C382S276000, C382S100000
Reexamination Certificate
active
07460711
ABSTRACT:
A method for reading a meter includes (1) capturing a first image of digits displayed by the meter, (2) roughly locating the digits by correlating the entire first image against symbols, (3) precisely locating the digits by correlating the digits against the symbols, which are now rotated, resized, and repositioned to maximize correlation, (4) determining and storing nominal centers of the digits in a nonvolatile memory. The method further includes (5) capturing a second image of the digits, (6) locating regions of interest in the second image according to the nominal centers, (7) determining vertical positions of full digits (or partial digits) in the regions of interest, (8) aligning symbols (or partial symbols) and the full digits (or the partial digits) according to the vertical position, and (9) correlating the symbol and the full digits (or the partial symbols and the partial digits).
REFERENCES:
patent: 6473517 (2002-10-01), Tyan et al.
patent: 2002/0131642 (2002-09-01), Lee et al.
patent: 2003/0007690 (2003-01-01), Rajagopal et al.
patent: 2003/0138146 (2003-07-01), Johnson et al.
Baer Richard L.
Butterworth Mark M
Mahowald Peter H.
Avago Technologies ECBU (IP) Singapore Pte. Ltd.
Bali Vikkram
Fujita Katrina
LandOfFree
Efficient method for reading meter values by processing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Efficient method for reading meter values by processing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Efficient method for reading meter values by processing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4040687