Efficient method for obtaining usable parts from a partially goo

Details Efficient method for obtaining usable parts from a partially goo Efficient method for obtaining usable parts from a partially goo

1996-07-24

1998-06-02

Yoo, Do Hyun

Static information storage and retrieval

Powering

36518907, 365195, 365200, 365201, 36523003, G11C 1300

Patent

active

057611459

ABSTRACT:
An integrated circuit memory device has multiple subarray partitions which can be independently isolated from the remaining circuitry on the integrated circuit. Subarrays of the integrated circuit can be independently tested. Should a subarray of the integrated circuit be found inoperable it is electrically isolated from the remaining circuitry on the integrated circuit so that it cannot interfere with the normal operation of the remaining circuitry. Defects such as power to ground shorts in a subarray which would have previously been catastrophic can be electrically isolated allowing the remaining functional subarrays to be utilized. Integrated circuit repair by isolation of inoperative elements eliminates the current draw and other performance degradations that have previously been associated with integrated circuits with defects repaired through the incorporation of redundant elements alone.

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G. Kitsukawa et al. 256Mb DRAM Technologies for File Applications; 1993 IEEE International Solid-State Circuits Conference pp. 48, 49, 261.

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