Data processing: structural design – modeling – simulation – and em – Electrical analog simulator – Of electrical device or system
Reexamination Certificate
2005-12-20
2005-12-20
Phan, Thai (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Electrical analog simulator
Of electrical device or system
C703S002000, C703S003000, C700S026000, C700S028000, C700S031000, C700S032000, C716S030000
Reexamination Certificate
active
06978229
ABSTRACT:
A computer implemented method for statistical modeling and simulation of the impact of global variation and local mismatch on the performance of integrated circuits, comprises the steps of: estimating a representation of component mismatch from device performance measurements in a form suitable for circuit simulation; reducing the complexity of statistical simulation by performing a first level principal component or principal factor decomposition of global variation, including screening; further reducing the complexity of statistical simulation by performing a second level principal component decomposition including screening for each factor retained in the first level principal component decomposition step to represent local mismatch; and performing statistical simulation with the joint representation of global variation and local mismatch obtained in the second level principal component decomposition step.
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Coder Dale
Guardiani Carlo
McNamara Patrick D.
Saxena Sharad
Schumaker Philip D.
Day Herng-der
Duane Morris LLP
PDF Solutions, Inc.
Phan Thai
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