Efficient functional test scheme incorporated in a programmable

Details Efficient functional test scheme incorporated in a programmable Efficient functional test scheme incorporated in a programmable

1994-02-09

1995-01-10

Wambach, Margaret Rose

Electrical pulse counters, pulse dividers, or shift registers: c

Systems

Identifying or correcting improper counter operation

377 29, H03K 2140

Patent

active

053814533

ABSTRACT:
A new technique for testing the counting functionality, loading functionality, and operational speed of a binary counter is provided wherein additional logic is incorporated into the counter to enable the counter to be functionally tested with a minimum number of clock cycles. Thus, for an n-bit counter which is partitionable into k subcounters, the counting functionality and operational speed of the counter may be tested in at most 2.sup.n/k +2 clock cycles, and the loading functionality of the counter may be tested in at most 2.sup.n/k +1 clock cycles.

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