Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-05-23
2008-08-12
Desire, Gregory M (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S103000, C382S204000
Reexamination Certificate
active
07412089
ABSTRACT:
The invention relates to a finder pattern for detection and location of at least one target feature in a target object. The finder pattern includes at least two triads arranged in predetermined locations in the target object, wherein each triad includes a first blob, a second blob, and a third blob, wherein each blob has substantially the same area and is positioned in a predetermined location in the target object. The locations of the first and second blobs are substantially equidistant from the third blob, and the locations of the first, second, and third blobs are not collinear. The invention further relates to a method for detecting a finder pattern in a target object, and a computer readable medium having instructions stored therein for detecting a finder pattern in a target object, which, when executed by a processor of a computing device, cause the computing device to carry out the steps of the method.
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Levinger James K.
Squires Sanford R.
Desire Gregory M
Kaufman Marc S.
Nextcode Corporation
Nixon-Peabody, LLP
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