Effective surface resistivity through image analysis

Details Effective surface resistivity through image analysis Effective surface resistivity through image analysis

2007-07-31

2007-07-31

Chen, Sophia S. (Department: 2852)

Electrophotography

Diagnostics

Consumable

C399S049000

Reexamination Certificate

active

11158820

ABSTRACT:
A method for determining the approximate surface conductivity of a photoreceptor surface. The method involves forming a latent image of a series of lines of different widths on the surface, developing the image, and then printing the image. Based on which lines print, the surface conductivity can be computed once the developability of isolated lines is established through a calibration procedure.

REFERENCES:
patent: 5457519 (1995-10-01), Morrison et al.
patent: 6006047 (1999-12-01), Mara et al.
Weiss et al., “Analysis of Electrostatic Latent Image Blurring Caused by Photoreceptor Surface Treatments,” J. of Imaging Science and Tech., vol. 40, No. 4, pp. 322-326, (1996).
Yi et al., “Numerical Simulation of the Lateral Conductivity of a Photoconductor Surface,” J. of Imaging Science and Tech., vol. 48, No. 4, pp. 294-305, (2004).

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