Edge rinse apparatus and edge rinse method

Photocopying – Projection printing and copying cameras – With temperature or foreign particle control

Reexamination Certificate

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C355S053000

Reexamination Certificate

active

06867842

ABSTRACT:
There is provided an edge rinse apparatus and an edge rinse method in which a swelling of an end portion of a resist produced by an edge rinse is eliminated. The resist coated on an unnecessary portion is exposed and is developed by using the edge rinse apparatus including a substrate chuck for sucking and holding a substrate, a motor for rotating the substrate chuck, a nozzle for discharging a developing solution to a principal surface of the substrate, a nozzle for discharging the developing solution to a rear surface of the substrate, and an exposure means with the substrate chuck as a mask.

REFERENCES:
patent: 4899195 (1990-02-01), Gotoh
patent: 5168304 (1992-12-01), Hattori
patent: 5965200 (1999-10-01), Tateyama et al.
patent: 5993547 (1999-11-01), Sato
patent: 6079428 (2000-06-01), Anai
patent: 6240874 (2001-06-01), Pike
patent: 6312171 (2001-11-01), Matsuyama et al.
patent: 1-119024 (1989-05-01), None
patent: 4-116917 (1992-04-01), None
patent: 4-150015 (1992-05-01), None
Research Disclosure, “Novel Edge Bead Removal Process”, Nov. 1991, No. 331, Kenneth Mason Publication, Ltd, England.*
Research Disclosure, “Edge-of Wafer System for Clearing Photoresist from wafers”, Aug. 1989, No. 304, Kenneth Maso Publications, Ltd, England.

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