Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2007-04-24
2007-04-24
Le, Thao P. (Department: 2818)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C438S700000, C438S709000
Reexamination Certificate
active
10967869
ABSTRACT:
An edge protection process for semiconductor device fabrication includes forming a protective layer on the circumferential edge region of a semiconductor substrate. The semiconductor substrate is placed in a plasma atmosphere and trench structures, such as deep trenches and shallow trench isolation structures are etched in the substrate. The protective layer substantially prevents the etching of the circumferential edge region, such that the formation of black silicon is substantially minimized during the etching process.
REFERENCES:
patent: 5387316 (1995-02-01), Pennell et al.
patent: 6797625 (2004-09-01), Kim et al.
patent: 6927172 (2005-08-01), Bergner et al.
patent: 2004/0259320 (2004-12-01), Holscher et al.
patent: 2005/0269700 (2005-12-01), Farnworth et al.
Singer, Neal, “Labs Patents Cool Tool To Produce Better Microchips,”Sandia LabNews, Mar. 27, 1998, http://www.sandia.gov/LabNews/LN03--27-98/chuck—story.html, [printed Sep. 24, 2004].
Davis Jon
Fuller Robert
Hagl Franz
Rennie Michael
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