Eddy current thickness gauge with constant magnetic bias

Details Eddy current thickness gauge with constant magnetic bias Eddy current thickness gauge with constant magnetic bias

1982-06-10

1985-11-12

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

G01B 710, G01R 3312

Patent

active

045530955

ABSTRACT:
An eddy current thickness probe for measuring the thickness of a weakly ferromagnetic material layer on a ferromagnetic base is provided with an essentially constant magnetic field bias. The magnetic field bias is of sufficient strength to substantially saturate ferromagnetic constituents in the weakly ferromagnetic layer. This eliminates any effects of changes in permeability of the weakly ferromagnetic layer which would otherwise impair the operation of an eddy current thickness gauge.

REFERENCES:
patent: 2226275 (1940-12-01), Abbott et al.
patent: 2933677 (1960-04-01), Lieber
patent: 3405353 (1968-10-01), Smith et al.
patent: 3611119 (1971-10-01), Madewell et al.
patent: 3659195 (1972-04-01), Blacherby
patent: 3761804 (1973-09-01), Stiengrover
patent: 3922599 (1975-11-01), Stiengrover et al.
patent: 3986105 (1976-12-01), Nix et al.

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