Eddy current testing program with scanning probe head having par

Details Eddy current testing program with scanning probe head having par Eddy current testing program with scanning probe head having par

1989-11-06

1991-05-28

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324202, 324225, 324227, 324262, G01N 2790, G01R 3312

Patent

active

050197770

ABSTRACT:
An eddy current testing system consists of a multi-sensor probe, a computer and a special expansion card and software for data collection and analysis. The probe incorporates an excitation coil, and sensor coils; at least one sensor coil is a lateral current-normal coil and at least one is a current perturbation coil.

REFERENCES:
patent: 2889514 (1959-06-01), Cowan et al.
patent: 2958818 (1960-11-01), Cowan et al.
patent: 3504276 (1970-03-01), Proctor et al.
patent: 3875502 (1975-04-01), Neumaier
patent: 4325026 (1982-04-01), Cooper, Jr. et al.

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