Eddy current probe for detecting localized defects in cylindrica

Details Eddy current probe for detecting localized defects in cylindrica Eddy current probe for detecting localized defects in cylindrica

1983-06-16

1986-08-26

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324220, 324262, 324DIG1, 336 84C, G01N 2790, G01R 3312

Patent

active

046085343

ABSTRACT:
Eddy current probes which are used to internally or externally inspect cylindrical components for localized defects have a main coil arrangement that induces and senses eddy current in the components. In accordance with the present invention, the probe further includes an element associated with the main coil arrangement to generate a detected defect signal distinct from a detected noise signal. The element can include one or more further coils mounted coaxially with the main coil arrangement so as to be between the main coil arrangement and the component to be inspected. The element may alternately be a cylindrical conductive sleeve mounted coaxially with the main coil arrangement so as to partially shield the coil arrangement from the component to be inspected. An electrical phase shifting network may be connected to the one or more further coils to enhance the distinction between the signals.

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