Eddy current probe apparatus and interlaced scanning method for

Details Eddy current probe apparatus and interlaced scanning method for Eddy current probe apparatus and interlaced scanning method for

1992-12-31

1994-08-02

Snow, Walter E.

Electricity: measuring and testing

Magnetic

Magnetic sensor within material

324262, G01N 2772, G01N 2782, G01B 3312

Patent

active

053349342

ABSTRACT:
A method and apparatus for metal flaw detection using multiple eddy current probes contained in a single carriage. An interlaced scanning method allows the scanning line spacing to be narrower than the spacing between probes on the probe carriage. The probes are held at a constant lift-off distance from the surface by a probe carriage that slides across the surface in a straight scan line. The probe carriage moves relative to a motorized bracket that slides the carriage across the surface.

REFERENCES:
patent: 3582771 (1971-01-01), Placke
patent: 4134067 (1979-01-01), Woodbury
patent: 4258319 (1981-03-01), Shimada et al.
patent: 4755753 (1988-07-01), Chern

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