Eddy current probe and method for flaw detection in metals

Details Eddy current probe and method for flaw detection in metals Eddy current probe and method for flaw detection in metals

1985-02-05

1987-06-23

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

G01N 2782

Patent

active

046756051

ABSTRACT:
A flaw detecting system is shown which includes a probe having a pair of ferrite cores with in-line gaps in close proximity to each other. An insulating, non-magnetic, non-conducting holder fills the gaps and supports the ferrite cores in a manner such that the cores form a generally V-shape. Each core is provided with an excitation winding and a detection winding. The excitation windings are connected in series or parallel with an rf port for connection thereof to a radio frequency source. The detection windings, which are differentially wound, are connected in series circuit to a detector port for connection to a voltage measuring instrument. The ferrite cores at the in-line gaps directly engage the metal surface of a test piece, and the probe is scanned along the test piece. In the presence of a flaw in the metal surface the detection winding voltages are unbalanced, and the unbalance is detected by the voltage measuring instrument. The insulating holder is provided with a profile which conforms to that of a prominent feature of the test piece to facilitate movement of the probe along the feature, typically an edge or a corner.

REFERENCES:
patent: 3617874 (1971-11-01), Forster
patent: 4286216 (1981-08-01), Auld et al.
Watjen et al, "Evaluation of a Novel Eddy Current Probe for Detecting Cracks Inside and at the Edges of Holes", Review of Progress in Quantitative Nondestructive Evaluation, (vol. 2B), 1983, pp. 1187-1202.
Watjen et al, "Evaluation of an Eddy-Current Tape-Head Probe", Review of Progress in Quantitative Nondestructive Evaluation, (vol. 3A), 1984, pp. 663-674.

Affiliated with

Also associated with

Rating

Eddy current probe and method for flaw detection in metals does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Eddy current probe and method for flaw detection in metals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Eddy current probe and method for flaw detection in metals will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-723840