Eddy current probe and inspection method

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

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Details

C324S242000

Reexamination Certificate

active

07154265

ABSTRACT:
An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

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H. Hoshikawa et al, “A New Eddy Current Surfact Probe for Short Flaws with Minimal Lift-off Noise”, Mar. 27, 2003, AIP Conference Proceedings, vol. 657(1), pp. 413-418.

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