Eddy current method for detecting a flaw in semi-conductive mate

Details Eddy current method for detecting a flaw in semi-conductive mate Eddy current method for detecting a flaw in semi-conductive mate

1983-12-12

1986-06-03

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324262, 336200, G01N 2790, G01R 3312

Patent

active

045932450

ABSTRACT:
An eddy current probe, excitable at frequencies equal to or greater 7 mhz., includes a substantially planar, spiral-like, unilaminar coil mounted on an insulative substrate. A protective layer covers the coil and is adapted to present only a minimal mechanical barrier between the coil and a region of material under test. The coil is a continuous run of copper having an effective diameter no greater than 2 mils. The coil, substrate and protective layer are a printed circuit board. A method of detecting flaws is also disclosed.

REFERENCES:
patent: 2955253 (1960-10-01), Bryant et al.
patent: 3132299 (1964-05-01), Hochschild
patent: 3568049 (1971-03-01), Barton
patent: 3901368 (1975-08-01), Klinger
patent: 3988665 (1976-10-01), Neumaier et al.
patent: 4107605 (1978-08-01), Hudgell
patent: 4109201 (1978-08-01), Pigeon et al.
patent: 4437062 (1984-03-01), Donnelly

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