Eddy current inspection method employing a probe array with test

Details Eddy current inspection method employing a probe array with test Eddy current inspection method employing a probe array with test

1993-03-19

1994-12-06

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With compensation for test variable

324219, 324227, 324232, 324242, 36457101, 364582, G01N 2790, G01R 3312, G01R 1700

Patent

active

053714628

ABSTRACT:
Disclosed are methods for processing and interpreting data acquired from an eddy current probe array inspection system, based on a background subtraction technique. Test and reference waveform data sets are acquired, and subsequently combined. However, the data sets are first normalized and registered to the same position, registering on characteristic signals produced when scanning over edges. Specific techniques are disclosed for normalizing, correcting for spatial offsets, determining the actual locations of edge signals by peak detection and correlation, and adjusting for variations in the number of points in the test and reference data sets.

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