Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-19
2007-06-19
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S255000, C382S152000
Reexamination Certificate
active
11100302
ABSTRACT:
An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
REFERENCES:
patent: 5345514 (1994-09-01), Mahdavieh et al.
patent: 5371462 (1994-12-01), Hedengren et al.
patent: 5442286 (1995-08-01), Sutton, Jr. et al.
patent: 6157699 (2000-12-01), Dunn
patent: 6378871 (2002-04-01), Roberts
patent: 6630996 (2003-10-01), Rao et al.
patent: 0437280 (1991-07-01), None
M. Sezgin et al., “Survey over image thresholding techniques and quantitative performance evaluation,” Journal of Electronic Imaging, vol. 13, No. 1, Jan. 2004, pp. 146-168.
M. Sezgin et al., “Selection of thresholding method for non-destructive testing applications,” IEEE, Proceedings 2001 International Conference on Image Processing, vol. 1 of 3. Conf. 8, Oct. 7, 2001, pp. 764-767.
N. Nacereddine et al., “Non-Parametric histogram-Based Thresholding Methods for Weld Defect Detection in Radiography,” Transactions on Engineering, Computing & Technology, ISSN 1305-5313, vol. 9, Nov. 2005, pp. 213-217.
J. Moysan et al., “Adapting an ultrasonic image threshold method to eddy current images and defining a validation domain of the thresholding method,” NDT&E International, vol. 32, No. 2, Mar. 1999, pp. 79-84.
B. Raj et al., “Frontiers in NDE research nearing maturity for exploitation to ensure structural integrity of pressure retaining components,” International Journal of Pressure Vessels and Piping, Elsevier Science Publishers, vol. 83, No. 5, May 2006, pp. 322-335.
EP Search Report, EP06251930, Jul. 5, 2006.
Dutta Amitabha
Gambrell Gigi Olive
Mandayam Shyamsunder Tondanur
Pisupati Preeti
Bui Bryan
Clarke Penny A.
General Electric Company
Le John
Patnode Patrick K.
LandOfFree
Eddy current inspection method and system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Eddy current inspection method and system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Eddy current inspection method and system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3824461