Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2005-06-14
2005-06-14
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C382S152000
Reexamination Certificate
active
06907358
ABSTRACT:
A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.
REFERENCES:
patent: 5345514 (1994-09-01), Mahdavieh et al.
patent: 5442286 (1995-08-01), Sutton et al.
patent: 5479834 (1996-01-01), Sanagawa et al.
patent: 5537334 (1996-07-01), Attaoui et al.
patent: 2003/0089183 (2003-05-01), Jacobsen et al.
U.S. patent application No. 10/011,190; filed Dec. 7, 2001; Dziech et al.
Sneed, Jr. Clifford
Suh Ui Won
Barlow John
Conte Francis L.
General Electric Company
Ramaswamy V. G.
Sun Xiuqin
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